A novel multi-modality spectro-microscopic system that combines far-field interferometry based optical microscopy imaging techniques (differential interference contrast microscopy and cross-polarized light microscopy), total internal reflection microscopy (total internal reflection fluorescence and scattering microscopy) and confocal spectroscopy (Raman spectroscopy and photoluminescence spectroscopy) is developed. Home-built post treatment stages (thermal annealing stage and solvent annealing stage) are integrated into the system to realize in situ measurements. Departing from conventional characterization methods in materials science mostly focused on structures on one length scale, the in situ multi-modality characterization system aims to uncover the structural information from the molecular level to the mesoscale. Applications of the system on the characterization of photoactive layers of bulk heterojunction solar cell, two-dimensional materials, gold nanoparticles, fabricated gold nanoparticle arrays and cells samples are shown in this dissertation.